![]() ![]() ![]() Wizard Function that Gives Novice Operators a Sense of Securityįor quick and easy operation by new operators, the LEXT OLS4000 has a detailed user designed wizard function. Each operator's ID is displayed on every report and specimen image, giving the administrator an at-a-glance picture of when each report was created or each image was captured and who created the report or image. Operators can log in to the LEXT OLS4000 using individualized IDs that provides them with an operation environment and database customized to their needs. In addition, 3D display and 3D measurements are available on the stitched image.Ĭustomizable ID Control and Security Enhancement ![]() The advanced stitching function of the OLS4000 enables you to stitch up to 500 images together to create a high-resolution, wide-field image. Higher-magnification imaging generally narrows the visual field range. This DIC method allows a user to obtain live images comparable to those of an electron microscope under relatively low power magnifications. Reproducing More Realistic Images of Micro Asperitiesĭifferential Interference Contrast (DIC) is an observation method for visualizing sub-nanometer micro asperities, which are far beyond the resolving power of a typical laser microscope. The LEXT OLS4000 assures both accuracy and repeatability - a world's first for laser microscopes. One is "Accuracy", which indicates how close a measurement value is to the true value, and the other is "Repeatability", which indicates the degree of variations among repeated measurement values. The performance of a measuring tool or its accuracy is expressed in two different terms. World's First Double Performance Guarantees Influence Derived from External Vibrations This mechanism eliminates the need for a dedicated vibration-damping stand, allowing measurements on any desktop. To eliminate external influences from the environment on the measurement, the LEXT OLS4000 incorporates a hybrid vibration-damping mechanism using coil springs and damping rubber. Minimize influence from Measurement Environments For example, even when the specimen is a transparent resin layer on a glass substrate, the shape and roughness of the layer below the transparent material as well as the thickness of the surface film can be measured. The multilayer mode can also analyze the multiple layers of a transparent specimen. Surface coating on a metallic materialĪnalysis of multiple layers of transparent material The OLS4000's multilayer mode facilitates observation and measurement of the transparent films. In general, with a laser scanning microscope, it can be difficult to measure a specimen, such as a transparent film on a metal substrate. Observation/Measurement of Top Surface of Transparent Material The LEXT OLS4000's new multilayer mode is capable of recognizing the peaks of the reflected light intensities of multiple layers and setting each layer as the focal point, making it possible to observe and measure the upper surface of a transparent specimen, as well as to analyze multiple layers and to measure the thickness of each layer. ![]() However, this design sometimes made it hard to identify the correct specimen shape of a transparent specimen because the laser beam would pass right through it. Traditionally, the focal point of laser microscopes was set to the position where the reflected light intensity on the specimen was the highest. Multilayer Mode Facilitates Measurement of Transparent Layers This system allows the LEXT OLS4000 to capture a clear image from a specimen consisting of materials with extremely varied reflectivity levels. The LEXT OLS4000 employs a newly developed dual confocal system. The OLS-4000's dedicated objective lenses with high numerical apertures and a dedicated 405nm optical system provide the capability to obtain maximum performance from the 405 nm laser, the LEXT OLS4000 can reliably measure acute-angled specimens that were previously impossible to measure. Outstanding Surface Roughness Analysis Capability.Magnification ranges from 108x - 17,280x satisfy the needs of today's researchers. The LEXT OLS4000 3D Laser Measuring Microscope is designed for nanometer level imaging, 3D measurement and roughness measurement. This product has been discontinued, check out our current laser confocal microscopes > Consultation Reception about Introduction.OEM Microscope Components for Integration.Semiconductor & Flat Panel Display Inspection Microscopes ▾.Aerospace/Wind Blade Inspection Scanners.Flaw Detectors / Phased Array Flaw Detectors ▾.Thickness and Flaw Inspection Solutions ▾. ![]()
0 Comments
Leave a Reply. |